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SHASHIN KAGAKU

Model: FTM

Category:

Exhibitor: SUNWAY SCIENTIFIC CORPORATION

Booth No: M335

Characteristic

The compact film thickness monitor is a reflection spectrophotometric film thickness meter that uses a small reflection probe and is applicable in all situations from the laboratory level to in-line 100% inspection in the production process.

▪ Compact probe with the optical fiber.
▪ Good repeatability of the film thickness measurement 0.1 nm.
▪ Multilayer film thickness measurement up to 9 layers.
▪ Material analysis function.
▪ Selectable light source.
▪ Wireless (Option).
▪ Film thickness end point detection software is included.
▪ Automatic mapping stage (Option)

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