Benchmark250 Advanced Optical Metrology System
Model: VIEW Benchmark 250
Category: Semiconductor Package Equipment
Exhibitor: TAIWAN OPTICAL MEASURING INSTRUMENT CO., LTD.
Booth No: M333
Characteristic
Benchmark250 is a compact benchtop model system engineered for high performance and reliability. Its stage is ideal for medium format metrology applications that require high throughput, accuracy, and precision making it a world-class metrology system.
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