Desktop AFM (Atomic Force Microscope)---the first choice for R&D and quality control with high CP value

Model: Nanoview1000

Category: Compound Semiconductor Equipment

Booth No: M334

Characteristic

1. Quickly and accurately obtain nano-surface features-high-resolution images can be obtained within five minutes
2. Intuitive operation and quick start --- less than 5 minutes from starting to scanning
3. The most cost-effective --- the price of other brands sold on the market is less than 1/2 (NTD can be owned within 1 million)
4. High rigidity design and anti-vibration system ---- easy measurement at any time and place
5. Designated and approved by the first-level research unit

Purpose:
Provide three-dimensional surface morphology images, including surface roughness, particle size, height difference and spacing

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Desktop AFM (Atomic Force Microscope)---the first choice for R&amp;D and quality control with high CP value

Characteristic

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Desktop AFM (Atomic Force Microscope)---the first choice for R&D and quality control with high CP value