Large Format Inspection & Metrology

 

Model: Nexview™ LS650

Category: Semiconductor Package Equipment

Exhibitor: AMETEK TAIWAN CORP., LTD.

Booth No: N208

 

Characteristic

 

The Nexview™ 650 metrology system is an inspection tool for automated measurement of injection molding tooling, PCBs, glass panels and other samples requiring an extended work volume up to 650 x 650 mm. It provides 2D & 3D measurements of a variety of surface features with sub-nanometer vertical precision and sub-micron lateral precision.
1. Measures virtually all types of surfaces, from rough to super smooth, including thin films, steep slopes, and large steps.
2. Sub-nanometer measurement precision is independent of field magnification
3. Gage capable performance - exceptional precision and repeatability for the most demanding production applications.
4. SureScan™ vibration tolerance technology - robust operation in virtually any environment.
5. Mx™ software enables seamless data exchange with other ZYGO Profilers including ZeGage™ Pro, NewView™ 9000, and Nexview™ NX2.

 

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