Category: Panel-Level Packaging (PLP) Equipment / Material
Exhibitor: CONTREL TECHNOLOGY CO., LTD.
Booth No: M210
Characteristic
●High-precision appearance defect detection system
●High precision OM measurement system
●Color Review function
●Die Measured shift
●Fluorescence inspection system
●Wafer or Panel Warpage measurement
Other Products
Products you may be interested in
Highest Rated Products