2024 Exhibitor Product
Highest Rated Products
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Non-Destructive Inspection System
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Vacuum Mixer
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Vacuum Mixer
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Centrifugal defoaming mixer
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Vacuum Syringe Centrifuge
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SHASHIN KAGAKU
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SHASHIN KAGAKU
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JASCO Fourier Transform Infrared Sepectromter
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JASCO UV-Visible/NIR Spectrophotometer
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JASCO Spectrofluorometer
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SHASHIN KAGAKU Planetary Centrifugal Mixer
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Hettich Centrifuges series
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PRO Scientific Handheld or Post-Mounted Laboratory Homogenizer
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Analytik-Jena High Intensity Wafer Inspection Lamp Yellow Filter
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ELMA P Multi-frequency Ultrasonic Cleaner
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Benchmark250 Advanced Optical Metrology System
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Summit 600 Advanced Optical Metrology System
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OGP CNC635 Multisensor Measurement System
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OGP ZONE3 Metrology Software
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OGP ShapeGrabber Automated 3D Laser scanning system
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OGP C-Vision Video Contour Projector
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OGP CNC500 3D Multisensor Measurement System
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OGP ZIP250 Multisensor Measurement System
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OGP E7 Fully Automatic Measurement System
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OGP SNAP350 Large Field Of View Video Measuring System
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2938-R Touchscreen Benchtop Optical Power Meters
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Displacement Measuring Interferometer
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Grinding
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AOI
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Wet Process
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Compound Semiconductor Equipment (23)
- All (175)
- Electronic Production Manufacturing Equipment (68)
- Semiconductor Package Equipment (28)
- Compound Semiconductor Equipment (23)
- Electronic Equipment Key Module & Parts (15)
- Micro LED Production Manufacturing Equipment (11)
- Semiconductor Smart Auto Solution (4)
- Battery Production Manufacturing (3)
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Default Order
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Switch to Grid View
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Non-Destructive Inspection System
Model: JadeSiC-NK / SP3055A
Category: Compound Semiconductor Equipment
Exhibitor:SPIROX CORPORATION
Booth No: N214
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PTFE Cables for Semiconductor Applications
Model: PTFE
Category: Compound Semiconductor Equipment
Exhibitor:HESHENG HARDWARE I CO., LTD.
Booth No: N310
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stainless steel plate
Model: 304/304L, 316/316L, 310S, S31803/S32205, S32750
Category: Compound Semiconductor Equipment
Exhibitor:JYE CHI CORPORATION
Booth No: N509
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Etch/Deposition/Plasma Dicing/Thermo Processing
Model: VERSALINE/Navigator/Odyssey/Vision/KOBUS/LAPECVD/T
Category: Compound Semiconductor Equipment
Exhibitor:SCIENTECH CORPORATION
Booth No: N303
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MFS
Model: MFS
Category: Compound Semiconductor Equipment
Exhibitor:SINOM CORPORATION
Booth No: N304
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Multifunctional high-performance AFM (roughness, film thickness, surface potential, wafer defect detection)
Model: Park Systems NX7
Category: Compound Semiconductor Equipment
Exhibitor:UTEK MATERIAL CO., LTD.
Booth No: M334
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Signal Integrity
Category: Compound Semiconductor Equipment
Exhibitor:INTEGRATED SERVICE TECHNOLOGY INC.
Booth No: N219
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Diener Parylene Coating
Model: Parylene P6
Category: Compound Semiconductor Equipment
Exhibitor:CHAO-DEE SCIENCE CO., LTD.
Booth No: N406