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Scanning 3D microscopy V8020D

Model: V8020D

Category: Electronic Equipment Key Module & Parts

Exhibitor: BENANO INC.

Booth No: M204

Characteristic

•High-speed imaging within 1 second
•Optimized for 100% inline inspection, featuring high-speed capture modes with a tailored balance of speed and precision.
• Visualized target alignment assistance
•Multiple advanced visualization modes. Assists users in rapidly identifying focal planes and signal locations within high-resolution images.
•Multi-layer image output capability
•Customizable multi-height 2D/3D image fusion

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