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PENTAD SCIENTIFIC CORPORATION

Area: 化合物半導體&先進封裝測試

Booth No: N503

Website: https://www.pentad.com.tw/

Exhibitor Profile

BUEHLER : Solutions for Materials Preparation, Testing & Analysis
Wilson Hardness : Hardness Testing & Hardness Test Blocks
Leica :
Light Microscope & Image analysis
TIC-3X / TXP Triple Ion Beam Milling System/Target Surfacing System
ACE 200 / ACE 600 High Vacuum Coater
UC7 / FC7 Ultramicrotome
Ted Pella/Pelco Microscopy Products for Science and Industry
Kleindielc SEM Nanoprobing
FTA Contact Angle
Jelight UVO Cleaner

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Buehler Leica

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