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DYMEK ASIA COMPANY LIMITED

Booth No: M328

Website: http://www.dymek.com

Exhibitor Profile

KLA Filmetrics Nanoscale Thin Film Thickness Gauge Measuring film thickness, n, k value and CIE-L*a*b* colorimetric accuracy reaches nanometer level, and can be upgraded to measure paper ratio (T) and curved samples KLA Filmetrics PROFILM3D optical 3D surface simulator 1. Number of detector images (CCD Camera Pixel Array): 5 million images 2. Field of View: 2 × 2 mm 3. Repeatability in Z-axis direction: 0.1~1nm 4. Sample reference rate: less than 0.05%

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