ZEISS 3D X-Ray Microscope
Model: 515 Versa; VersaXRM 615; VersaXRM 730
Category: Semiconductor Package Equipment
Exhibitor: SCIENTECH CORPORATION
Booth No: N705
Characteristic
Non-destructive imaging
High resolution (0.45 μm)
Pure 3D system
2-Stage magnification (geometric + optical)
Support AI DeepRecon Pro
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