SEMILAB TAIWAN CO. LTD.
Area: 電子生產製造設備
Booth No: N220
Website: https://semilab.com/
Exhibitor Profile
SEMILAB delivers advanced metrology solutions for semiconductor, More‑than‑Moore, solar, and display applications. Our 45 product lines and 300+ tools support full R&D‑to‑production workflows, covering electrical, optical , thin‑film characterization, and automation from manual stations to full fab‑level integration.
Brands
SEMILAB TAIWAN CO. LTD.
Exhibit Products
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Advanced 3D Surface & Profile Metrology for Next‑Generation Panel‑Level Packaging (AFM)
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Wafer / carrier substrate edge profile measurement system (E-Shape)
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PSI 3000 Polarized Stress Imaging System
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Infradred Interfacial Reflection Imaging for void inspection
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MICROSPOT SPECTROSCOPIC ELLIPSOMETER (uSE)
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300mm Spectral Photoluminescence system
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Contactless Resistivity Mapping Tool for 300 mm Semi‑insulating Wafers
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Spreading Resistance Profiling System with Integrated I‑V Measurement Capability
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CARRIER-RESOLVED PHOTO & PARALLEL DIPOLE LINE HALL MEASUREMENT SYSTEM (PDL)
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MicroLED functional inspection system based on photoluminescence imaging
Exhibitor Press Release
- Semilab introduces new, comprehensive metrology solution for microLED functional inspection 2026-02-27
- Semilab Launches New R&D Website to Highlight Material & Life Science Metrology Portfolio 2026-02-27
- Defect Inspection in the Early Stages of III-V Device Manufacturing 2026-02-27
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