CARRIER-RESOLVED PHOTO & PARALLEL DIPOLE LINE HALL MEASUREMENT SYSTEM (PDL)

Model: PDL 1000

Category: Compound Semiconductor Equipment

Booth No: N220

Characteristic

Carrier‑Resolved Photo & Parallel Dipole Line (PDL) Hall Measurement System

The Carrier‑Resolved Photo & Parallel Dipole Line (PDL) Hall Measurement System is an advanced metrology platform engineered to accurately characterize carrier transport properties in a wide range of semiconductor materials. By combining carrier‑resolved photo‑Hall techniques with the Parallel Dipole Line (PDL) Hall configuration, the system enables high‑precision extraction of key parameters including:

Carrier mobility (μ)
Carrier concentration (n/p)
Carrier type determination
Photogenerated carrier dynamics
Resistivity and conductivity mapping
Hall coefficients and magneto‑transport behavior

Designed for both research laboratories and semiconductor production environments, the PDL system provides exceptional sensitivity for low‑mobility and wide‑bandgap materials, supports flexible illumination conditions for photo‑induced studies, and offers stable, repeatable performance across diverse sample types.
This next‑generation Hall measurement platform delivers the accuracy, reliability, and versatility required for modern semiconductor device development—from power electronics and optoelectronics to 2D materials and emerging compound semiconductors.